Authors of papers presented at this conference and within the scope of MDPI Instruments may submit a technically extended version to the Special Issue of Instuments - "Advanced Measurement Instruments and Metrological Frameworks for Emerging Intelligent Technologies".
This Special Issue aims to collect high-quality contributions presented at and inspired by IEEE MetroXRAINE 2026, as well as original research from the broader scientific community, addressing the design, characterization, validation, and application of innovative measurement instruments and systems for emerging intelligent technologies. Particular attention will be devoted to advanced sensing architectures, AI-assisted measurement systems, XR-based experimental platforms, neuroengineering instrumentation, digital twins, cyber–physical systems, and human-centered measurement approaches. Contributions addressing uncertainty evaluation, performance benchmarking, metrological traceability, standardization, explainability, and trustworthiness of intelligent systems are especially welcome.
ABOUT THE JOURNAL
Instruments (ISSN: 2410-390X) is an international, peer-reviewed open-access journal that provides an advanced forum for studies related to the design and applications of instruments, apparatuses, and experimental techniques in disciplinary and interdisciplinary research. Our aim is to encourage researchers to publish their experimental and computational results in as much detail as necessary.
SPECIAL ISSUE GUEST EDITORS
Olfa Kanoun, Technische Universität Chemnitz, Germany
Leila Es Sebar, University of Torino
Marisa Pesola, University of Naples Federico II
